Test theory for assessing IR test collections

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

How good is an IR test collection? A series of papers in recent years has addressed the question by empirically enumerating the consistency of performance comparisons using alternate subsets of the collection. In this paper we propose using Test Theory, which is based on analysis of variance and is specifically designed to assess test collections. Using the method, we not only can measure test reliability after the fact, but we can estimate the test collection's reliability before it is even built or used. We can also determine an optimal allocation of resources before the fact, e.g. whether to invest in more judges or queries. The method, which is in widespread use in the field of educational testing, complements data-driven approaches to assessing test collections. Whereas the data-driven method focuses on test results, test theory focuses on test designs. It offers unique practical results, as well as insights about the variety and implications of alternative test designs.

Original languageEnglish
Title of host publicationProceedings of the 30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR'07
Pages367-374
Number of pages8
DOIs
StatePublished - 2007
Event30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR'07 - Amsterdam, Netherlands
Duration: 23 Jul 200727 Jul 2007

Publication series

NameProceedings of the 30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR'07

Conference

Conference30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR'07
Country/TerritoryNetherlands
CityAmsterdam
Period23/07/0727/07/07

Keywords

  • Information retrieval
  • Test collections
  • Test theory

ASJC Scopus subject areas

  • Information Systems
  • Software
  • Applied Mathematics

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