Study in coverage-driven test generation

Mike Benjamin, Daniel Geist, Alan Hartman, Yaron Wolfsthal, Gerard Mas, Ralph Smeets

Research output: Contribution to journalConference articlepeer-review


One possible solution to the verification crisis is to bridge the gap between formal verification and simulation by using hybrid techniques. This paper presents a study of such a functional verification methodology that uses coverage of formal models to specify tests. This was applied to a modern superscalar microprocessor and the resulting tests were compared to tests generated using existing methods. The results showed some 50% improvement in transition coverage with less than a third the number of test instructions, demonstrating that hybrid techniques can significantly improve functional verification.

Original languageEnglish
Pages (from-to)970-975
Number of pages6
JournalProceedings - Design Automation Conference
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1999 36th Annual Design Automation Conference (DAC) - New Orleans, LA, USA
Duration: 21 Jun 199925 Jun 1999

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering


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