A Study in Coverage-Driven Test Generation

Mike Benjamin, Daniel Geist, Alan Hartman, Yaron Wolfsthal, Gerard Mas, Ralph Smeets

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


One possible solution to the verification crisis is to bridge the gap between formal verification and simulation by using hybrid techniques. This paper presents a study of such a functional verification methodology that uses coverage of formal models to specify tests. This was applied to a modern superscalar microprocessor and the resulting tests were compared to tests generated using existing methods. The results showed some 50% improvement in transition coverage with less than a third the number of test instructions, demonstrating that hybrid techniques can significantly improve functional verification.

Original languageEnglish
Title of host publicationProceedings of the 36th Conference on Design Automation
EditorsMary Jane Irwin
PublisherACM Press
Number of pages6
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1999 36th Annual Design Automation Conference (DAC) - New Orleans, LA, USA
Duration: 21 Jun 199925 Jun 1999


ConferenceProceedings of the 1999 36th Annual Design Automation Conference (DAC)
CityNew Orleans, LA, USA

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering


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