Statistical inference for masked data

Benjamin Reiser; Emmanuel Yashchin; Betty J. Flehinger

doi:10.1016/S0362-546X(97)00322-2

Statistical inference for masked data

Benjamin Reiser, Emmanuel Yashchin, Betty J. Flehinger

Department of Statistics

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	4425-4432
Number of pages	8
Journal	Nonlinear Analysis, Theory, Methods and Applications
Volume	30
Issue number	7
DOIs	https://doi.org/10.1016/S0362-546X(97)00322-2
State	Published - Dec 1997

Keywords

Competing causes
Kaplan-Meier
Proportional Hazards
Reliability

ASJC Scopus subject areas

Analysis
Applied Mathematics

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10.1016/S0362-546X(97)00322-2

Cite this

@article{0a73673e02d94af79c519428116de92c,

title = "Statistical inference for masked data",

keywords = "Competing causes, Kaplan-Meier, Proportional Hazards, Reliability",

author = "Benjamin Reiser and Emmanuel Yashchin and Flehinger, {Betty J.}",

year = "1997",

month = dec,

doi = "10.1016/S0362-546X(97)00322-2",

language = "English",

volume = "30",

pages = "4425--4432",

journal = "Nonlinear Analysis, Theory, Methods and Applications",

issn = "0362-546X",

publisher = "Elsevier",

number = "7",

}

TY - JOUR

T1 - Statistical inference for masked data

AU - Reiser, Benjamin

AU - Yashchin, Emmanuel

AU - Flehinger, Betty J.

PY - 1997/12

Y1 - 1997/12

KW - Competing causes

KW - Kaplan-Meier

KW - Proportional Hazards

KW - Reliability

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U2 - 10.1016/S0362-546X(97)00322-2

DO - 10.1016/S0362-546X(97)00322-2

M3 - Article

AN - SCOPUS:0043046869

SN - 0362-546X

VL - 30

SP - 4425

EP - 4432

JO - Nonlinear Analysis, Theory, Methods and Applications

JF - Nonlinear Analysis, Theory, Methods and Applications

IS - 7

ER -

Statistical inference for masked data

Keywords

ASJC Scopus subject areas

Access to Document

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