Predicting fall probability based on a validated balance scale

Alaa Masalha, Nadav Eichler, Shmuel Raz, Adi Toledano-Shubi, Daphna Niv, Ilan Shimshoni, Hagit Hel-Or

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Accidental falls are the most frequent injury of old age and have dramatic implications on the individual, family, and the society as a whole. To date, fall prediction estimation is clinical, relying on the expertise of the physiotherapist for performing the diagnosis based on standard scales, such as the highly common and validated Berg Balance Scale (BBS). Unfortunately, the BBS is a time consuming subjective score, prone to variability and inconsistency between examiners. In this study, we developed an objective, computational tool, which automates the BBS fall assessment process and allows easy, efficient and accessible assessment of fall risk. The tool is based on a novel multi depth-camera human motion tracking system integrated with Machine Learning algorithms. The system enables large scale screening of the general public at very little cost while significantly reducing physiotherapist resources. The system was pilot tested in the physiotherapy unit at a major hospital and showed high rates of fall risk predictions as well as correlation with physiotherapists BBS scores on individual BBS motion tasks.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
PublisherIEEE Computer Society
Pages1224-1231
Number of pages8
ISBN (Electronic)9781728193601
DOIs
StatePublished - Jun 2020
Event2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 - Virtual, Online, United States
Duration: 14 Jun 202019 Jun 2020

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2020-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
Country/TerritoryUnited States
CityVirtual, Online
Period14/06/2019/06/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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