| Original language | English |
|---|---|
| Pages (from-to) | 393 |
| Number of pages | 1 |
| Journal | Microelectronics Reliability |
| Volume | 26 |
| Issue number | 2 |
| DOIs | |
| State | Published - 1986 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Safety, Risk, Reliability and Quality
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering