Original language | English |
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Pages (from-to) | 393 |
Number of pages | 1 |
Journal | Microelectronics Reliability |
Volume | 26 |
Issue number | 2 |
DOIs | |
State | Published - 1986 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Safety, Risk, Reliability and Quality
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering