Instant Exceptional Model Mining using weighted controlled pattern sampling

Sandy Moens, Mario Boley

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

When plugged into instant interactive data analytics processes, pattern mining algorithms are required to produce small collections of high quality patterns in short amounts of time. In the case of Exceptional Model Mining (EMM), even heuristic approaches like beam search can fail to deliver this requirement, because in EMM each search step requires a relatively expensive model induction. In this work, we extend previous work on high performance controlled pattern sampling by introducing extra weighting functionality, to give more importance to certain data records in a dataset. We use the extended framework to quickly obtain patterns that are likely to show highly deviating models. Additionally, we combine this randomized approach with a heuristic pruning procedure that optimizes the pattern quality further. Experiments show that in contrast to traditional beam search, this combined method is able to find higher quality patterns using short time budgets.

Original languageEnglish
Title of host publicationAdvances in Intelligent DataAnalysis XIII - 13th International Symposium, IDA 2014, Proceedings
EditorsHendrik Blockeel, Matthijs van Leeuwen, Veronica Vinciotti
PublisherSpringer Verlag
Pages203-214
Number of pages12
ISBN (Electronic)9783319125701
DOIs
StatePublished - 2014
Externally publishedYes
EventPAKDD 2006 International Workshop on Knowledge Discovery in Life Science Literature, KDLL 2006 - Singapore, Singapore
Duration: 9 Apr 20069 Apr 2006

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume8819
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

ConferencePAKDD 2006 International Workshop on Knowledge Discovery in Life Science Literature, KDLL 2006
Country/TerritorySingapore
CitySingapore
Period9/04/069/04/06

Bibliographical note

Publisher Copyright:
© Springer International Publishing Switzerland 2014

Keywords

  • Controlled pattern sampling
  • Exceptional Model Mining
  • Subgroup discovery

ASJC Scopus subject areas

  • Theoretical Computer Science
  • General Computer Science

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