Hierarchical symmetry

H. Zabrodsky; Shmuel Peleg; David Avnir

doi:10.1109/ICPR.1992.201915

Hierarchical symmetry

H. Zabrodsky
, Shmuel Peleg
, David Avnir

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The authors view symmetry as a continuous feature and dependent on resolution. Combining a continuous symmetry measure (CSM) with a multiresolution scheme, the authors present a method that hierarchically detects symmetric and almost symmetric patterns. Evaluation of symmetry at low frequencies guides the process to find the symmetry at higher frequencies

Original language	English
Title of host publication	International Conference on Pattern Recognition
Pages	9-9
Volume	3
DOIs	https://doi.org/10.1109/ICPR.1992.201915
State	Published - 1 Jan 1992
Externally published	Yes

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10.1109/ICPR.1992.201915

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title = "Hierarchical symmetry",

abstract = "The authors view symmetry as a continuous feature and dependent on resolution. Combining a continuous symmetry measure (CSM) with a multiresolution scheme, the authors present a method that hierarchically detects symmetric and almost symmetric patterns. Evaluation of symmetry at low frequencies guides the process to find the symmetry at higher frequencies",

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AB - The authors view symmetry as a continuous feature and dependent on resolution. Combining a continuous symmetry measure (CSM) with a multiresolution scheme, the authors present a method that hierarchically detects symmetric and almost symmetric patterns. Evaluation of symmetry at low frequencies guides the process to find the symmetry at higher frequencies

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M3 - Conference contribution

SN - 0-8186-2920-7

VL - 3

SP - 9

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BT - International Conference on Pattern Recognition

ER -

Hierarchical symmetry

Abstract

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