Original language | English |
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Place of Publication | Washington DC, USA |
Publisher | IEEE Computer Society |
Number of pages | 115 |
ISBN (Print) | 978-0-7695-3314-8 |
State | Published - 10 Aug 2008 |
Fifth International Workshop on Fault Diagnosis and Tolerance in Cryptography, 2008, FDTC 2008, Washington, DC, USA, 10 August 2008
Luca Breveglieri (Editor), Shay Gueron (Editor), Israel Koren (Editor), David Naccache (Editor), Jean Pierre Seifert (Editor)
Research output: Book/Report › Book › peer-review