TY - GEN
T1 - EFFICIENT STRING MATCHING IN THE PRESENCE OF ERRORS.
AU - Landau, Gad M.
AU - Vishkin, Uzi
PY - 1985
Y1 - 1985
N2 - The string matching problem is considered, where differences between characters of the pattern and characters of the text are allowed. Each difference is due to either a mismatch between a character of the text and a character of the pattern or a superfluous character in the text or a superfluous character in the pattern. Given a text of length n, a pattern of length m and an integer k, an algorithm is presented for finding all occurrences of the pattern in the text, each with at most k differences. Given the same input, an algorithm is presented for finding all occurrences of the pattern in the text, each with at most k mismatches (superfluous characters in either the text or the pattern are not allowed). This algorithm runs in O(k(m log m plus n)) time.
AB - The string matching problem is considered, where differences between characters of the pattern and characters of the text are allowed. Each difference is due to either a mismatch between a character of the text and a character of the pattern or a superfluous character in the text or a superfluous character in the pattern. Given a text of length n, a pattern of length m and an integer k, an algorithm is presented for finding all occurrences of the pattern in the text, each with at most k differences. Given the same input, an algorithm is presented for finding all occurrences of the pattern in the text, each with at most k mismatches (superfluous characters in either the text or the pattern are not allowed). This algorithm runs in O(k(m log m plus n)) time.
UR - http://www.scopus.com/inward/record.url?scp=0022198799&partnerID=8YFLogxK
U2 - 10.1109/sfcs.1985.22
DO - 10.1109/sfcs.1985.22
M3 - Conference contribution
AN - SCOPUS:0022198799
SN - 0818606444
SN - 9780818606441
T3 - Annual Symposium on Foundations of Computer Science (Proceedings)
SP - 126
EP - 136
BT - Annual Symposium on Foundations of Computer Science (Proceedings)
PB - IEEE
ER -