Contour-based feature strings for 2-D shape recognition using EREW PRAM architecture

Its'hak Dinstein, Gad M. Landau

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presents parallel computable contour based feature strings for two dimensional shape recognition. Parallel techniques are used for contour extraction and for computation of normalized contour based features independent of scale and rotation. The EREW PRAM architecture is considered, but the technique can be adapted to other parallel architectures. Illustrated examples are presented.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRichard D. Juday
PublisherPubl by Int Soc for Optical Engineering
Pages166-175
Number of pages10
ISBN (Print)0819403466
StatePublished - 1990
Externally publishedYes
EventReal-Time Image Processing II - Orlando, FL, USA
Duration: 16 Apr 199018 Apr 1990

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1295
ISSN (Print)0277-786X

Conference

ConferenceReal-Time Image Processing II
CityOrlando, FL, USA
Period16/04/9018/04/90

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Contour-based feature strings for 2-D shape recognition using EREW PRAM architecture'. Together they form a unique fingerprint.

Cite this