Computationally fast bayesian recognition of complex objects based on mutual algebraic invariants

Zhibin Lei, Daniel Keren, David Cooper

Research output: Contribution to conferencePaperpeer-review

Abstract

An effective approach has appeared in the literature for recognizing 2D curve or 3D surface objects of modest complexity based on representing an object by a single implicit polynomial of 3rd or 4th degree, computing a vector of Euclidean or affine invariants which are functions of the polynomial coefficients, and doing Bayesian object recognition of the invariants [5], thus producing low computational cost robust recognition. This paper extends the approach, as well as an initial work on mutual invariants recognizers [4], to the recognition of objects too complicated to be represented by a single polynomial(Figure 1). Hence, an object to be recognized is partitioned into patches, each patch is represented by a single implicit polynomial, mutual invariants are computed for pairs of polynomials for pairs of patches, and object recognition is Bayesian recognition of vectors of self and mutual invariants. We will discuss why complete object geometry can be captured by the geometry of pairs of patches, how to design mutual invariants, and how to match patches in the data with those in the database at low computational cost. The approach is low computational cost recognition of partially occluded articulated objects in arbitrary position and in noise by recognizing the self or joint geometry of one or more patches.

Original languageEnglish
Pages635-638
Number of pages4
StatePublished - 1996
Externally publishedYes
EventProceedings of the 1995 IEEE International Conference on Image Processing. Part 3 (of 3) - Washington, DC, USA
Duration: 23 Oct 199526 Oct 1995

Conference

ConferenceProceedings of the 1995 IEEE International Conference on Image Processing. Part 3 (of 3)
CityWashington, DC, USA
Period23/10/9526/10/95

ASJC Scopus subject areas

  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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