Bayesian Inference for Masked System Lifetime Data

B. Reiser, I. Guttman, Dennis K. J. Lin, Frank M. Guess, John S. Usher

Research output: Contribution to journalArticlepeer-review


Estimating component and system reliabilities frequently requires using data from the system level. Because of cost and time constraints, however, the exact cause of system failure may be unknown. Instead, it may only be ascertained that the cause of system failure is due to a component in a subset of components. This paper develops methods for analysing such masked data from a Bayesian perspective. This work was motivated by a data set on a system unit of a particular type of IBM PS/2 computer. This data set is discussed and our methods are applied to it.
Original languageEnglish
Pages (from-to)79-90
JournalJournal of the Royal Statistical Society. Series C: Applied Statistics
Issue number1
StatePublished - 1995


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