Applications of likelihood based-methods for the reliability parameter of the location and scale exponential distribution

Shaul K. Bar-Lev, Frank A. Van der Duyn Schouten

Research output: Contribution to journalArticlepeer-review

Abstract

Based on a type-2 censored-sample we consider a likelihood-based inference for the reliability parameter R(t) of the location and scale exponential distribution. More specifically, we derive the profile and marginal likelihoods of R(t). A numerical example is presented demonstrating the flavor of results that can be obtained by likelihood-based methods.

Original languageEnglish
Pages (from-to)115-126
Number of pages12
JournalJournal of Applied Statistical Science
Volume16
Issue number1
StatePublished - 2008

Keywords

  • Life testing
  • Likelihood interval
  • Location and scale exponential distribution
  • Marginal likelihood
  • Plausibility
  • Profile likelihood
  • Reliability
  • Type-2 censored sample

ASJC Scopus subject areas

  • Statistics and Probability

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