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Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing methodology

  • Anna Brook
  • , Edison Cristofani
  • , Mathias Becquaert
  • , Ben Lauwens
  • , Joachim Jonuscheit
  • , Marijke Vandewal

Research output: Contribution to journal › Article › peer-review

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