3-D radar image processing methodology for non-destructive testing of aeronautics composite materials and structures

A. Brook, E. Cristofani, M. Vandewal, C. Matheis, J. Jonuscheit

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


Recently, there has been a significant interest in employing high frequency radar imagery for many industrial oriented and security applications. The quality control of aeronautics composite multi-layered materials and structures through Non-Destructive Testing (NDT) is the main focus of this study. The main motivations for using this technology are: it allows penetration of most non-metal and non-polarized materials, it provides the ability for three-dimensional (3-D) imagery and in-depth information, and the millimeter waves (mmW) pose no health risk to the operator. The main goal of this research is to develop an integrated, semi-automatic and near real-time mode-operated image processing methodology for frequency-modulated continuous-wave (FMCW) millimeter wave images with center frequencies around 100 GHz and 300 GHz. The proposed methodology firstly foresees to process reflectance and transmittance 3-D imagery by extracting areas of interest and object's boundaries at two operated frequencies. Then, the detected areas are subjected to a multi-source database and integrated by a decision tree algorithm. The fused information is used to identify defects and in-homogeneities within the objects. Finally, the post-processing phase examines and evaluates the spatial accuracy of the extracted information.

Original languageEnglish
Title of host publication2012 IEEE Radar Conference
Subtitle of host publicationUbiquitous Radar, RADARCON 2012 - Conference Program
Number of pages6
StatePublished - 2012
Externally publishedYes
Event2012 IEEE Radar Conference: Ubiquitous Radar, RADARCON 2012 - Atlanta, GA, United States
Duration: 7 May 201211 May 2012

Publication series

NameIEEE National Radar Conference - Proceedings
ISSN (Print)1097-5659


Conference2012 IEEE Radar Conference: Ubiquitous Radar, RADARCON 2012
Country/TerritoryUnited States
CityAtlanta, GA

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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